Nuclear Sciences & Technologies

EPJ Applied Physics presents Review of EELS over the last 50 years by Christian Colliex

‘In this special volume, we are deeply honored to publish an extensive review, by Christian Colliex, of the development of Electron Energy Loss Spectroscopy (EELS) in a Transmission Electron Microscope (TEM)… We warmly thank Dr. Colliex for this contribution that will undoubtably become a major reference for researchers in the electron microscopy and materials science community.’
Damien Jacob, Suzanne Giorgio and Virginie Serin

From early to present and future achievements of EELS in the TEM
By Christian Colliex

Editors-in-Chief
C. De Saint Jean and G. Moutiers
ISSN: 2491-9292 (Electronic Edition)

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